Discover the superior quality and performance of the Fischer PHASCOPE PMP10 DUPLEX / 603-689 with Onrion LLC in United States . Whether you are looking for reliability or efficiency, this product meets all your industrial needs.
The PHASCOPE PMP10 DUPLEX / 603-689 is designed to provide optimal performance and durability in various applications. Known for its high-quality construction and innovative features, it is a preferred choice for professionals.
Key Features of PHASCOPE PMP10 DUPLEX / 603-689 :
At Onrion LLC , we offer the PHASCOPE PMP10 DUPLEX / 603-689 at competitive prices and with the fastest delivery times across United States . Our expert team is ready to assist you with all your inquiries and provide tailored solutions to meet your specific needs.
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Important Notice: While we supply Fischer products, Onrion LLC is not an authorized distributor. All rights are reserved by the manufacturers and their official partners.
BRAND | Fischer |
Product | PHASCOPE PMP10 DUPLEX / 603-689 |
Internal code | ONR4592066 |
Technical specification | Particularly suitable for measuring duplex layers on steel or iron (e.g. lacquer/Zn/Fe) with simultaneous measurement of the individual thicknesses of paint and Zinc layer Also suitable for fire-galvanized layers without pronounced diffusion layer (< 1 μm) as well as for ZnAl alloy layers. It is necessary but calibration to the present metal layer material. Only in conjunction with ESG20 measuring probe General features: - Ergonomic design with large, backlit LC display - Alphanumeric data entry - Static evaluation with date and time - Menu-driven operator guidance - Automatic detection of base material and selection of measurement method - Memory for up to 100 applications divided into max. 4000 blocks - Dynamic storage space allocation for up to 20,000 measured values - RS 232 interface Selectable measurement modes: - Duplex measurement: measurement of duplex layers by combining magnetic inductive and phase sensitive eddy current method - ISO/NE (in duplex mode): measurement of electrically non-conductive Layers on non-ferrous metal substrates according to the eddy current method Automatic selection of duplex or ISO/NE measurement mode, depending on substrate material. - Dual mode: measurement of Ne/Fe or ISO/NE layers according to the magnetic inductive or eddy current method with automatic detection of base material. |